Properties of Higher Criticism under Strong Dependence by Peter Hall

نویسنده

  • JIASHUN JIN
چکیده

The problem of signal detection using sparse, faint information is closely related to a variety of contemporary statistical problems, including the control of false-discovery rate, and classification using very high-dimensional data. Each problem can be solved by conducting a large number of simultaneous hypothesis tests, the properties of which are readily accessed under the assumption of independence. In this paper we address the case of dependent data, in the context of higher criticism methods for signal detection. Shortrange dependence has no first-order impact on performance, but the situation changes dramatically under strong dependence. There, although higher criticism can continue to perform well, it can be bettered using methods based on differences of signal values or on the maximum of the data. The relatively inferior performance of higher criticism in such cases can be explained in terms of the fact that, under strong dependence, the higher criticism statistic behaves as though the data were partitioned into very large blocks, with all but a single representative of each block being eliminated from the dataset.

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Properties of Higher Criticism under Strong Dependence

The problem of signal detection using sparse, faint information is closely related to a variety of contemporary statistical problems, including the control of false-discovery rate, and classification using very high-dimensional data. Each problem can be solved by conducting a large number of simultaneous hypothesis tests, the properties of which are readily accessed under the assumption of inde...

متن کامل

A study on the dependence of DC electrical properties and nanostructure of Cu thin films on film thickness

This paper reports the correlation between film thickness, nanostructure and DC electrical properties of copper thin films deposited by PVD method on glass substrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used for crystallography and morphology investigation, respectively. Resistivity was measured by four point probe instrument, while a Hall effects measurement system w...

متن کامل

A study on the dependence of DC electrical properties and nanostructure of Cu thin films on film thickness

This paper reports the correlation between film thickness, nanostructure and DC electrical properties of copper thin films deposited by PVD method on glass substrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used for crystallography and morphology investigation, respectively. Resistivity was measured by four point probe instrument, while a Hall effects measurement system w...

متن کامل

Higher Criticism in the Context of Unknown Distribution, Non-independence and Classification

Higher criticism has been proposed as a tool for highly multiple hypothesis testing or signal detection, initially in cases where the distribution of a test statistic (or the noise in a signal) is known and the component tests are statistically independent. In this paper we explore the extent to which the assumptions of known distribution and independence can be relaxed, and we consider too the...

متن کامل

Scanning hall probe microscopy technique for investigation of magnetic properties

Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor.  SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2008